MultiCLEM (multiplexed correlative light and electron microscopy) is a method to speed up analysis of yeast strains by electron microscopy using fluorescent barcoding. We developed it in collaboration with the lab of John Briggs.

The MultiCLEM method consists of a protocol to label yeast strains with fluorescent barcodes and a set of software tools based on

MATLAB,

IMOD,

SerialEM,

and ilastik to process the data and setup the imaging.

© 2016-2020 Maya Schuldiner Laboratory

               last update 12/2021

Department of Molecular Genetics
Weizmann Institute of Science
Rehovot, Israel