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MultiCLEM (multiplexed correlative light and electron microscopy) is a method to speed up analysis of yeast strains by electron microscopy using fluorescent barcoding. We developed it in collaboration with the lab of John Briggs.

MultiCLEM method explained

The MultiCLEM method consists of a protocol to label yeast strains with fluorescent barcodes and a set of software tools based on




and ilastik to process the data and setup the imaging.

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