top of page
MultiCLEM (multiplexed correlative light and electron microscopy) is a method to speed up analysis of yeast strains by electron microscopy using fluorescent barcoding. We developed it in collaboration with the lab of John Briggs.
The MultiCLEM method consists of a protocol to label yeast strains with fluorescent barcodes and a set of software tools based on
and ilastik to process the data and setup the imaging.
bottom of page