top of page

MultiCLEM (multiplexed correlative light and electron microscopy) is a method to speed up analysis of yeast strains by electron microscopy using fluorescent barcoding. We developed it in collaboration with the lab of John Briggs.

Image.png

The MultiCLEM method consists of a protocol to label yeast strains with fluorescent barcodes and a set of software tools based on

MATLAB,

IMOD,

SerialEM,

and ilastik to process the data and setup the imaging.

Read the paper
bottom of page